FT-IR Spectrometer BZFS-501
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FT-IR Spectrometer BZFS-501

FT-IR Spectrometer BZFS-501 is a high-performance device designed for precise material analysis. It comes with an advanced Michelson interferometer for precise spectral analysis. This spectrometer also features a high-resolution detector and intelligent software to ensure accurate and repeatable measurements across a wavenumber range of 7800 to 375 cm⁻¹. It offers a moisture-proof design and a user-friendly interface for seamless operation. Our FT-IR Spectrometer BZFS-501 is ideal for materials science, pharmaceuticals, and academic research.

$ 15065

Wave Number Range 7800 to 375 cm⁻¹
Resolution 1 cm⁻¹
Wave Number Accuracy 0.01 cm⁻¹
Signal-to-Noise Ratio 30000:1
Beamsplitter KBr coated with Ge
Light Source Air-cooled IR source
Interferometer Michelson interferometer (30° incidence)
A/D Converter 24-bit at 500M Hz, USB 2.0
Product Dimension 450 × 350 × 210 mm
Packaging Dimension 570 × 470 × 470 mm
Net Weight 14 Kg
Gross Weight 35 Kg
  • 15T Press

  • Sheet Mold

  • Agate Mortar

  • 100g KBr

  • Demountable Liquid Cell

  • Fixed Liquid Cell

  • Gas Cell

  • ZNSE Crystal

  • Diamond Crystal

  • Intelligent Electronic Moisture-proof Cabinet

  • Germanium Crystal

  • Diffuse Reflection

  • Magnetic Film Holder

  • High-Resolution Spectroscopy

  • High-Stability Components

  • Reliable Optical System

  • Advanced Moisture-Proof Design

FT-IR Spectrometer BZFS-501 can be used in materials science, pharmaceuticals, and petrochemicals for compound identification and quality control. It is also essential in research labs for polymer analysis and contamination detection.


X-ray Fluorescence Spectrometer

Labzee X-ray Fluorescence Spectrometers are for precise, non-destructive elemental analysis of solids, liquids, and powders. They detect a broad range of elements from sodium to uranium, with detection limits as low as 2 ppm. These spectrometers feature high-resolution detectors, automatic filter selection, and intuitive user interfaces for seamless operation. Our spectrometers ensure compliance with international standards, supporting applications in quality control, material verification, and regulatory compliance.

Handheld XRF Spectrometer BZXS-501

  • Analytical Method : Energy Dispersive X-ray fluorescence
  • Detector : Silicon Drift Detector (SDD)
  • Detector Resolution : Up to 125 eV

$ 26025

Handheld XRF Spectrometer BZXS-502

  • Elements Measuring Range : Magnesium to Uranium
  • Simultaneous Analysis Range : Analysis of 40 elements
  • Content Range : ppm-99.99%

$ 30475

Optical Emission Spectrometer

Optical Emission Spectrometer from Labzee provides elemental composition analysis of metals and alloys through optical emission spectroscopy. Our Optical Emission Spectrometers feature wavelength ranges from 165 to 589 nm and resolution of 10 pm/pixel for spectral analysis. Models with Paschen-Runge full-vacuum optical structures, CMOS array detectors, argon gas excitation, automatic purge, and thermal compensation provide different configurations for metal and alloy elemental analysis. OES Spectrometers provide elemental composition data to support metal and alloy identification, composition analysis, and material quality testing.

Optical Emission Spectrometer BZES-501
  • Wavelength Range : 165-589 nm
  • Room Temperature Requirement : 35°C ± 5°C
  • Operating Temperature : 10°C - 35°C (Ideal at 25°C)

$ 55545